Nasdaq

Applied Materials Unveils SEMVision™ H20 for Enhanced Nanoscale Defect Analysis in Semiconductor Manufacturing

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...
pv magazine International

Defect analysis promises kesterite solar cells with 18.47% efficiency

An international research group has found that the presence of a few lattice defects in a kesterite PV cell material can actually improve efficiency, rather than lowering it. The group believes that ...
Nasdaq

Applied Materials Accelerates Chip Defect Review with Next-Gen eBeam System

SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...
EDN

SoftJin’s NxDAT Mask Defect Analysis Software combines Mask Inspection and Design Automation worlds

SoftJin, a provider of Customized Automation software for Electronic Design and Manufacturing, announces NxDAT, software for efficient Analysis of Defects identified by Mask Inspection Systems. The ...